zhou yang和Claude Opus 5
cac6ce47ce
接口在 components/phonerail_hal/include/，宿主机链 sim/、ESP32-S3 链 esp/ （IDF v5.4 新版 i2c_master / gpio / LEDC / esp_timer）。 sim 提供 A3 起要用的假板子控制面：假 I²C 器件（寄存器表 + 大端 + 指针自增）、 可注入 NAK / 器件失联、GPIO 外部驱动与写计数、虚拟时钟。 组件名不叫 hal —— ESP-IDF 自己有 components/hal（driver 依赖它），同名会盖掉。 验收：bash host/test.sh → 3 条 ctest 全过；build_idf.ps1 → 编过且零警告。 Co-Authored-By: Claude Opus 5 <[email protected]> Claude-Session: https://claude.ai/code/session_01QYuExfgyYa6DzRRcUso8M8
137 行
4.6 KiB
C
137 行
4.6 KiB
C
/* A2 验收主项：能在假总线上挂一个器件并读回预置值。
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顺带把「器件失联 / 偶发 NAK」这两种后面 A15 要用的故障注入也测掉。 */
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#include <string.h>
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#include "sim_hal.h"
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#include "unity.h"
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#define INA226_CH1 0x40 /* 设计文档 §8.2 的地址表；A3 才会真的写驱动 */
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#define PCA9555 0x20
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void setUp(void) { sim_hal_reset(); }
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void tearDown(void) {}
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static void init_bus(void)
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{
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TEST_ASSERT_EQUAL_INT(HAL_OK, hal_i2c_init(NULL));
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}
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static void test_use_before_init_is_state_error(void)
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{
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sim_i2c_add(INA226_CH1, 2);
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uint8_t rd[2];
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TEST_ASSERT_EQUAL_INT(HAL_ERR_STATE, hal_i2c_read(INA226_CH1, rd, sizeof(rd)));
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}
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/* ⭐ A2 的验收判据本身 */
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static void test_read_back_preset_register(void)
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{
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init_bus();
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sim_i2c_add(INA226_CH1, 2);
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sim_i2c_set_reg(INA226_CH1, 0x02, 0x1234); /* INA226 的 Bus Voltage 寄存器 */
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const uint8_t ptr = 0x02;
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uint8_t rd[2] = { 0, 0 };
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TEST_ASSERT_EQUAL_INT(HAL_OK, hal_i2c_write_read(INA226_CH1, &ptr, 1, rd, sizeof(rd)));
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TEST_ASSERT_EQUAL_HEX8(0x12, rd[0]); /* 大端 */
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TEST_ASSERT_EQUAL_HEX8(0x34, rd[1]);
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TEST_ASSERT_EQUAL_UINT32(1, sim_i2c_dev(INA226_CH1)->n_read);
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}
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static void test_write_stores_big_endian_and_logs_bytes(void)
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{
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init_bus();
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sim_i2c_add(INA226_CH1, 2);
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const uint8_t wr[3] = { 0x05, 0x12, 0x34 };
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TEST_ASSERT_EQUAL_INT(HAL_OK, hal_i2c_write(INA226_CH1, wr, sizeof(wr)));
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TEST_ASSERT_EQUAL_HEX16(0x1234, sim_i2c_get_reg(INA226_CH1, 0x05));
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const sim_i2c_dev_t *d = sim_i2c_dev(INA226_CH1);
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TEST_ASSERT_EQUAL_UINT8(3, d->last_write_len);
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TEST_ASSERT_EQUAL_HEX8_ARRAY(wr, d->last_write, 3);
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}
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/* 寄存器指针自增：一次事务连读两个寄存器，真器件就是这个行为。 */
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static void test_pointer_auto_increments(void)
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{
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init_bus();
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sim_i2c_add(INA226_CH1, 2);
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sim_i2c_set_reg(INA226_CH1, 0x01, 0xAAAA);
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sim_i2c_set_reg(INA226_CH1, 0x02, 0xBBBB);
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const uint8_t ptr = 0x01;
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uint8_t rd[4];
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TEST_ASSERT_EQUAL_INT(HAL_OK, hal_i2c_write_read(INA226_CH1, &ptr, 1, rd, sizeof(rd)));
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TEST_ASSERT_EQUAL_HEX8(0xAA, rd[0]);
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TEST_ASSERT_EQUAL_HEX8(0xBB, rd[2]);
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}
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/* PCA9555 是 8 位寄存器；同一套 HAL 要能同时伺候两种宽度。 */
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static void test_byte_wide_device(void)
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{
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init_bus();
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sim_i2c_add(PCA9555, 1);
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const uint8_t wr[3] = { 0x06, 0xFF, 0x0F }; /* 配置寄存器 Port0/Port1 */
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TEST_ASSERT_EQUAL_INT(HAL_OK, hal_i2c_write(PCA9555, wr, sizeof(wr)));
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TEST_ASSERT_EQUAL_HEX16(0x00FF, sim_i2c_get_reg(PCA9555, 0x06));
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TEST_ASSERT_EQUAL_HEX16(0x000F, sim_i2c_get_reg(PCA9555, 0x07));
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}
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static void test_absent_device_naks(void)
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{
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init_bus();
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TEST_ASSERT_EQUAL_INT(HAL_ERR_NAK, hal_i2c_probe(0x77)); /* 总线上没这个地址 */
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sim_i2c_add(INA226_CH1, 2);
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TEST_ASSERT_EQUAL_INT(HAL_OK, hal_i2c_probe(INA226_CH1));
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sim_i2c_set_present(INA226_CH1, false); /* 器件失联（A15 降级矩阵） */
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TEST_ASSERT_EQUAL_INT(HAL_ERR_NAK, hal_i2c_probe(INA226_CH1));
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}
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static void test_transient_nak_then_recovers(void)
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{
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init_bus();
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sim_i2c_add(INA226_CH1, 2);
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sim_i2c_inject_nak(INA226_CH1, 2); /* 接下来两次事务失败 */
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uint8_t rd[2];
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TEST_ASSERT_EQUAL_INT(HAL_ERR_NAK, hal_i2c_read(INA226_CH1, rd, sizeof(rd)));
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TEST_ASSERT_EQUAL_INT(HAL_ERR_NAK, hal_i2c_read(INA226_CH1, rd, sizeof(rd)));
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TEST_ASSERT_EQUAL_INT(HAL_OK, hal_i2c_read(INA226_CH1, rd, sizeof(rd)));
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/* NAK 掉的事务不该被算成一次成功访问 */
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TEST_ASSERT_EQUAL_UINT32(1, sim_i2c_dev(INA226_CH1)->n_read);
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}
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/* 半个寄存器的长度：真器件上是未定义行为，这里必须当场报错而不是悄悄凑合。 */
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static void test_partial_register_length_rejected(void)
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{
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init_bus();
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sim_i2c_add(INA226_CH1, 2);
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uint8_t rd[1];
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TEST_ASSERT_EQUAL_INT(HAL_ERR_ARG, hal_i2c_read(INA226_CH1, rd, 1));
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const uint8_t wr[2] = { 0x05, 0x12 };
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TEST_ASSERT_EQUAL_INT(HAL_ERR_ARG, hal_i2c_write(INA226_CH1, wr, sizeof(wr)));
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}
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static void test_address_out_of_range(void)
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{
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init_bus();
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TEST_ASSERT_EQUAL_INT(HAL_ERR_ARG, hal_i2c_probe(0x80));
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}
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int main(void)
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{
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UNITY_BEGIN();
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RUN_TEST(test_use_before_init_is_state_error);
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RUN_TEST(test_read_back_preset_register);
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RUN_TEST(test_write_stores_big_endian_and_logs_bytes);
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RUN_TEST(test_pointer_auto_increments);
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RUN_TEST(test_byte_wide_device);
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RUN_TEST(test_absent_device_naks);
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RUN_TEST(test_transient_nak_then_recovers);
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RUN_TEST(test_partial_register_length_rejected);
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RUN_TEST(test_address_out_of_range);
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return UNITY_END();
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}
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